کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
748094 1462241 2014 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Corner induced non-uniform electric field effect on the electrical reliability of metal–oxide–semiconductor devices with non-planar substrates
ترجمه فارسی عنوان
گوشه ای اثر میدان الکتریکی غیر یکنواخت را بر روی قابلیت اطمینان الکتریکی متالا اکسیدا با زیربناهای غیر مسطح
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
چکیده انگلیسی


• Non-planar MOS exhibits irregular stress induced degradation.
• Deep depletion is area dependent in planar MOS but irregular in non-planar one.
• Concave and convex corners in non-planar MOS sustain severe non-uniform E-field.

Stress induced irregular tunneling current and interface trap characteristics were observed in non-planar substrate metal–oxide–semiconductor (MOS) capacitors. The oxide electric field distributions in the concave and convex corner regions of non-planar structure are different. After stressing, the inversion tunneling current was observed to decrease gradually in non-planar sample but decrease then increase in planar one. Moreover, the non-planar sample exhibits two peaks phenomenon in interface capacitance (Cit) after stress which is different from planar one with one peak. A model describing the role of deep depletion (DD) for sample with different treatments is also proposed for the observation.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solid-State Electronics - Volume 91, January 2014, Pages 100–105
نویسندگان
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