کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
75871 | 49125 | 2010 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Preparation and microstructural characterization of oriented titanosilicate ETS-10 thin films on indium tin oxide surfaces
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
کاتالیزور
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Oriented polycrystalline ETS-10 thin films (average thickness ∼1.50–1.75 μm) were prepared on the ITO glass substrates using secondary growth of ETS-10 multilayers with a partial a(b)-out-of-plane preferred crystal orientation. After secondary growth, the films showed a columnar grain microstructure, and a significantly increased degree of a(b)-out-of-plane orientation. This orientation is desirable for advanced applications of ETS-10 films. The prepared films were strongly attached to the ITO glass substrates as evidenced by the absence of discernible differences in the substrate coverage with film after a 60-min ultrasonication in water.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microporous and Mesoporous Materials - Volume 131, Issues 1–3, June 2010, Pages 401–406
Journal: Microporous and Mesoporous Materials - Volume 131, Issues 1–3, June 2010, Pages 401–406
نویسندگان
Sezin Galioğlu, Mariam N. Ismail, Juliusz Warzywoda, Albert Sacco Jr., Burcu Akata,