Investigations of the crystallization mechanism of CrSb and CrSb2 multilayered films using in-situ X-ray diffraction and in-situ X-ray reflectometry

► CrSb and CrSb2 crystallize at very low temperatures in multilayered films. ► Film thickness determines crystallization at interfaces or from amorphous intermediate. ► Prior to crystallization of CrSb2, highly textured CrSb crystallizes first. ► Depending on the film thickness CrSb2 exhibits different preferred orientations.