Influence of temperature-induced copper diffusion on degradation of selective chromium oxy-nitride solar absorber coatings

• We study influence of thermal copper diffusion on stability of solar absorbers.
• Outward diffusion formed CuO islands on top and Kirkendall voids to the interface.
• Optical selectivity was significantly degraded due to the Cu diffusion.
• The relation between diffusion and optical degradation was simulated.
• The formed voids in Cu substrate increased thermal emittance.

Temperature-induced copper diffusion process and its influences on optical degradation and long-term stability of solar absorber coatings on copper substrates were investigated at intermediate temperatures of 248–500 °C. The studied absorbers were sputtered chromium oxy-nitride absorbers having tin oxide anti-reflection coatings. The absorbers were aged by means of thermal accelerated ageing studies and short-period heat treatments up to 500 °C for two hours.Ageing mechanisms and degradation of the absorbers were analysed before and after the ageing studies by optical measurements (solar absorptance with a UV/Vis/NIR spectrophotometer and thermal emittance by FTIR spectrophotometry), microstructural analysis using a field-emission scanning electron microscope (FESEM) equipped with an energy dispersive X-ray spectrometer (EDS) and a transmission electron microscope (TEM) with an EDS, composition by time-of-flight elastic recoil detection analysis (TOF-ERDA) and an X-ray photoelectron spectroscope (XPS), and adhesion by tensile test. The relation between optical degradation and diffusion mechanisms was studied using optical modelling and simulation. The results clearly revealed the mechanism of outward copper diffusion: diffusion of copper substrate atoms into the coating and through the coating to the surface, formation of copper oxide islands on the surface of the coating, and formation of voids in the substrate surface. The relation between the diffusion mechanisms and increase in thermal emittance of the absorber surface was demonstrated.

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