کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
78709 | 49340 | 2013 | 6 صفحه PDF | دانلود رایگان |

The radiation response of GaAs PiN solar cells with 50 stacked layers containing self-aligned In0.4Ga0.6As quantum dots (QDs) was compared to that of GaAs PiN solar cells with non QD layers. Those solar cells were radiated with 1 MeV electrons up to 1×1016/cm2, and the change in their electrical characteristics under AM 0 was investigated using an in-situ measurement technique. After electron irradiation at 1×1016/cm2, the value of open circuit voltage (VOC) for the In0.4Ga0.6As 50 QD and the non QD solar cells remained 90 and 80% of the initial value, respectively. On the other hand, the values of short circuit current (ISC) and maximum power (PMAX) for the 50 QD solar cells became approximately 80 and 55% of the initial value by electron irradiation at 1×1016/cm2, respectively, although the non QD solar cells showed 95% for ISC and 63% for PMAX after the irradiation. The recovery of the electrical characteristics of both the InGaAs 50 QD and the non QD solar cells irradiated with electrons at 1×1016/cm2 were observed under AM0 light illumination at RT.
► GaAs solar cells with quantum dot (QDs) and non-QDs were irradiated 1−MeV electrons.
► The radiation response of the solar cells was in-situ measured.
► VOC for QD cells showed better radiation resistance than that for non-QD cells.
► After irradiation, characteristics of both cells recovered under AM0 light at RT.
Journal: Solar Energy Materials and Solar Cells - Volume 108, January 2013, Pages 263–268