Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

Morphological and electrical defects in polycrystalline silicon solar cells are distinguished by scanning electron acoustic microscopy (SEAM) and electron beam induced current (EBIC) techniques, respectively. It was found that while some defects are both morphologically and electrically detectable, some are predominantly only either electrical or morphological in nature. Combining both SEAM and EBIC is therefore an ideal approach as the two techniques can provide complementary information on both the morphological and electrical manifestation of the defects.

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► Defects in solar cells can be either predominantly morphological or electrical in nature or both.
► Electrical properties can vary at different locations within a single morphological defect.
► Morphological and electrical defects in solar cells are distinguished by SEAM and EBIC techniques.
► Morphological defects are detected by SEAM, whereas electrically-active defects are detected by EBIC.
► Proposed methods characterize defect properties and their effects on solar cell performance.