کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7965518 1514180 2015 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Obstacle strength of binary junction due to dislocation dipole formation: An in-situ transmission electron microscopy study
ترجمه فارسی عنوان
استحکام اتصال دوتایی به علت تشکیل دوقطبی جابجایی: یک مطالعه میکروسکوپ الکترونی انتقال
موضوعات مرتبط
مهندسی و علوم پایه مهندسی انرژی انرژی هسته ای و مهندسی
چکیده انگلیسی
We report the experimental observation of the ½<111> edge dislocation dipole formation and annihilation in ultra-high purity Fe using transmission electron microscopy (TEM) in-situ straining. The observation is confirmed by TEM image simulations. The edge dipole is formed by the interaction of a moving screw dislocation with an obstacle of dislocation character. It results from the glide of the two arms of the dislocation on two different glide planes, which stabilizes the dipole that is closed by a jog. The dipole is later released from the obstacle and disappears, presumably by gliding of the dipole's edge segments along their Burgers vector and freeing the mobile screw dislocation from the jog. This mechanism leads to enhanced obstacle strength of the immobile dislocation well above Orowan critical stress, promoting forest strength.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Nuclear Materials - Volume 465, October 2015, Pages 648-652
نویسندگان
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