کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7996791 1516211 2016 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Structure and properties of sputter-deposited Al-Sn-N thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فلزات و آلیاژها
پیش نمایش صفحه اول مقاله
Structure and properties of sputter-deposited Al-Sn-N thin films
چکیده انگلیسی
The material is hard at room temperature, with nanoindentation values of 17-24 GPa. Coatings on silica substrates are transparent and yellow to red-brown in colour. This is quantified as a shifting absorption edge, which moves from 211 to 510 nm, corresponding to an optical band gap of 5.9 and 2.4, respectively, as the Sn-content is increased. The index of refraction varies between 2.0 and 2.6. The deposited materials are thus hard, and have a tuneable absorption edge, which could be applicable in optical applications as a multifunctional optical filter with scratch resistant properties.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 682, 15 October 2016, Pages 42-51
نویسندگان
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