UV irradiation and H2 passivation processes to classify and distinguish the origin of luminescence from thin film of nc-Si deposited by PECVD technique

UV irradiation and H2 passivation processes to classify and distinguish the origin of luminescence from thin film of nc-Si deposited by PECVD technique

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 623, 25 February 2015, Pages 89-95

Atif Mossad Ali,