کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8001111 | 1516277 | 2014 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Structural, electrical and optical characterization of Ti-doped ZnO films grown by atomic layer deposition
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فلزات و آلیاژها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Structural, electrical and optical characterization of Ti-doped ZnO films grown by atomic layer deposition Structural, electrical and optical characterization of Ti-doped ZnO films grown by atomic layer deposition](/preview/png/8001111.png)
چکیده انگلیسی
Thin films of Ti-doped ZnO (TZO) have been deposited using Atomic Layer Deposition (ALD) achieving highly conductive materials with resistivities down to 1.8 Ã 10â3 Ω cm at 1.7 cat% Ti doping, with a maximum dopant efficiency of 31%. The high conductivity and doping efficiency suggests a good distribution of dopants, otherwise a common challenge for doping by ALD. The charge mobility for Ti concentrations below 1.2 cat% was higher than for pure ZnO. The texture of the films changed from a predominantly c-axis to a-axis orientation with increasing Ti concentration, while the lattice parameters remained unaltered. The TZO films were highly transparent with an absorbance in the visible range of less than 2% for 200 nm films. The band gap increased with Ti content from 3.28 eV for pure ZnO to 3.67 eV for 5.9 cat% Ti, attributed to the Burstein Moss effect. The index of refraction varied with the Ti content showing a minimum of 1.90 for 1.7 cat% Ti.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Alloys and Compounds - Volume 616, 15 December 2014, Pages 618-624
Journal: Journal of Alloys and Compounds - Volume 616, 15 December 2014, Pages 618-624
نویسندگان
Kristin Bergum, Per-Anders Hansen, Helmer Fjellvåg, Ola Nilsen,