Stress-induced martensitic transformation in nanometric NiTi shape memory alloy strips: An in situ TEM study of the thickness/size effect

Ultrathin NiTi miniature strips of 40-83 nm in thickness were fabricated by means of focused ion beam milling from a polycrystalline NiTi shape memory alloy. The NiTi strips were subjected to tensile deformation inside a transmission electron microscope using a self-designed tension apparatus for in situ examination of the effect of thickness on the stress induced martensitic transformation behavior in the strips. The study revealed that the transformation was completely suppressed in a strip of 40 nm in thickness whereas it was possible in thicker strips. In these strips, the stress induced martensitic transformation was found to commence sequentially in thicker strips first and then in thinner strips at higher strain (stress) levels, demonstrating the size effect. This size effect is attributed to the effect of damaged surfaces, including a Ga+-impregnated amorphous layer on one side of the strip caused by sample fabrication using FIB and oxidation affected layers on both sides. This means that the observed “size effect” is not an intrinsic behavior of the martensitic transformation in NiTi but of extrinsic influences.