کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8150721 1524426 2014 16 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Development of GaN wafers via the ammonothermal method
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
Development of GaN wafers via the ammonothermal method
چکیده انگلیسی
The second and more serious issue is a cracking that occurs when thick boules are produced. Currently we routinely produce ammonothermal growth over a millimeter in thickness without any cracking. However, as the thickness increases cracks develop. From a production viewpoint, the production of thick crystals is beneficial since it allows a single wafer to be processed into many. By improving a variety of parameters, the crack density was reduced and the maximum crack-free growth increased from 1 mm to 2.6 mm.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 403, 1 October 2014, Pages 3-6
نویسندگان
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