کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8164189 1525669 2018 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Improved interface growth and enhanced flux pinning in YBCO films deposited on an advanced IBAD-MgO based template
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
Improved interface growth and enhanced flux pinning in YBCO films deposited on an advanced IBAD-MgO based template
چکیده انگلیسی
The growth mechanism is studied from the flux pinning point of view in small-scale YBa2Cu3O6+x (YBCO) thin films deposited on a polycrystalline hastelloy with advanced IBAD-MgO based buffer layer architecture. When compared the situation with YBCO films grown on single crystal substrates, the most critical issues that affect the suitable defect formation and thus the optimal vortex pinning landscape, have been studied as a function of the growth temperature and the film thickness evolution. We can conclude that the best critical current property in a wide applied magnetic field range is observed in films grown at relatively low temperature and having intermediate thickness. These phenomena are linked to the combination of the improved interface growth, to the film thickness related crystalline relaxation and to the formation of linear array of edge dislocations that forms the low-angle grain boundaries through the entire film thickness and thus improve the vortex pinning properties. Hence, the optimized buffer layer structure proved to be particularly suitable for new coated conductor solutions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica C: Superconductivity and its Applications - Volume 545, 15 February 2018, Pages 50-57
نویسندگان
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