کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9572168 1388504 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling
چکیده انگلیسی
In multi-element alloys preferential sputtering is a common phenomenon. In the steady state of sputtering, a significant depletion in Cu is found. At the oxide/metal interface, a distinct enrichment of copper is found for all alloys and treatments. The degree of this Cu enrichment depends on the pretreatment. It is higher for the electrochemically-passivated samples than for samples with oxide layers grown during melt spinning.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 1, 30 September 2005, Pages 162-166
نویسندگان
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