کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9585161 | 1392331 | 2005 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure](/preview/png/9585161.png)
چکیده انگلیسی
In spite of the fact that most X-ray photoelectron spectroscopy (XPS) instruments are capable of acquiring multispectral data sets, few analysts choose to do so due to the time required to obtain an adequate signal to noise ratio. A significant reduction in the acquisition time can be achieved by the use of principal component analysis to reduce noise in the data set. Additionally a reduction in computational requirements of Principal Component Analysis (PCA) can be gained by prior application of a singular value decomposition sorting procedure. Data transformation prior to processing minimises the difficulties arising due to the non-uniform distribution of Poissonian noise through the spectra. The use of the procedure is illustrated to produce quantified elemental images from wide energy spectra, and chemical state maps requiring curve fitting to high energy resolution spectra. Finally we discuss the effect sample charging during analysis of insulators has on the images.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 148, Issue 1, July 2005, Pages 29-40
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volume 148, Issue 1, July 2005, Pages 29-40
نویسندگان
John Walton, Neal Fairley,