کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9585408 | 1505782 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Synchrotron radiation photoabsorption and photoemission spectroscopy for thermal-induced reoriented Si polymer
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موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
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چکیده انگلیسی
The effect of laser annealing on electronic structures and molecular orientation for poly(dimethylsilane) {PDMS, [Si(CH3)2]n} has been studied by synchrotron radiation photoemission and photoabsorption spectroscopy. Prior to annealing, PDMS powder was mounted on the basal plane of highly oriented pyrolytic graphite. Both Si 1s X-ray photoemission spectroscopy and near-edge X-ray absorption fine structure spectroscopy (NEXAFS) at Si 1s edge show that electronic structures have been modified due to annealing. Furthermore, the angle-dependent NEXAFS spectra clearly indicate that the annealed products maintain a specific orientation. Interestingly, no such kind of orientation is present in as-received PDMS powder as no angle-dependency is observed before annealing.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 144â147, June 2005, Pages 323-326
Journal: Journal of Electron Spectroscopy and Related Phenomena - Volumes 144â147, June 2005, Pages 323-326
نویسندگان
K.G. Nath, I. Shimoyama, T. Sekiguchi, Y. Baba,