Long-term accelerated current operation of white light-emitting diodes

Long-term degradation tests regarding white light-emitting diodes based on InGaN were performed under accelerated current conditions, and the half-life of the light's output was estimated. An estimated mean half-life of 1.5×104 h was obtained under the recommended 20-mA operating condition. The change in the emission spectrum was found to be slight, and the color quality was considered generally satisfactory over the long term.