کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9590519 | 1507002 | 2005 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Theoretical study on insertion of silylenoid H2SiLiF into X-H bonds (X=CH3, SiH3, NH2, PH2, OH, SH and F)
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Theoretical study on insertion of silylenoid H2SiLiF into X-H bonds (X=CH3, SiH3, NH2, PH2, OH, SH and F) Theoretical study on insertion of silylenoid H2SiLiF into X-H bonds (X=CH3, SiH3, NH2, PH2, OH, SH and F)](/preview/png/9590519.png)
چکیده انگلیسی
The insertion reactions of silylenoid H2SiLiF into X-H bonds (X=CH3, SiH3, NH2, PH2, OH, SH and F), H2SiLiF+XHâH3SiX+LiF, have been theoretically studied using quantum chemistry methods. The structures of reactants, transition states, intermediates, and products were fully optimized at the MP2(full)/6-31G(d) level. The final energies were obtained by the G3(MP2) method. The reaction pathways were identified by intrinsic reaction coordinate (IRC) calculations. The results indicate that when X=CH3, SiH3, PH2, and SH the insertion reactions of silylenoid H2SiLiF into X-H bonds proceed via two reaction pathways, I and II, forming the substituted silanes H3SiX, with dissociation of LiF. When X=NH2, OH, and F the reaction proceed via only pathway I. It is found that all insertion reactions are exothermic. The barriers of pathway II are higher than those of pathway I with the exception of X=SiH3. The reaction mechanism of each pathway was revealed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Molecular Structure: THEOCHEM - Volume 755, Issues 1â3, 30 November 2005, Pages 55-63
Journal: Journal of Molecular Structure: THEOCHEM - Volume 755, Issues 1â3, 30 November 2005, Pages 55-63
نویسندگان
Ju Xie, Dacheng Feng, Shengyu Feng, Jie Zhang,