کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9670603 1450404 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Improvement in the aspect ratio of fabricated minute dots by the volume change thermal lithography technique
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Improvement in the aspect ratio of fabricated minute dots by the volume change thermal lithography technique
چکیده انگلیسی
Volume change thermal lithography has been developed as a low cost and simple lithography technique for application in optical mastering. The combination of the temperature distribution induced by a focused laser spot with a Gaussian distribution and a special multilayer consisting of TbFeCo and ZnS-SiO2 are utilized. Application of heat to these materials induces interdiffusion and as a result local volume expansion leading to the formation of a convex surface region. This technique was used to fabricate nano-dots with dimensions less them 100 nm on the sample surface. Typical nano-dot height, however, was less than 20 nm and this value is not sufficient for the pit height of an optical master disk. To address this problem, a PtOx film was inserted between the TbFeCo and ZnS-SiO2 layers. Laser irradiated PtOx decomposed to Pt and oxygen leading to additional surface protrusion due to the combination of the thermally induced interdiffusion of the TbFeCo and ZnS-SiO2 region and PtOx decomposition induced compressive stress. Nano-dots of 110 nm diameter and 37 nm height were successfully fabricated. Transmission electron microscope (TEM) observations of the nano-dot structure are reported.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volumes 78–79, March 2005, Pages 359-363
نویسندگان
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