کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9676117 | 1454115 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The effect of monolayers' alkyl chain length on atomic force microscopy anodization lithography
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
شیمی کلوئیدی و سطحی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: The effect of monolayers' alkyl chain length on atomic force microscopy anodization lithography The effect of monolayers' alkyl chain length on atomic force microscopy anodization lithography](/preview/png/9676117.png)
چکیده انگلیسی
The effects of the alkyl chain length for AFM anodization nanolithography on different alkylsilane monolayers were demonstrated by fabricating line and dot patterns. The different threshold voltage was observed on different alkylsilane monolayers. The observed threshold voltage gaps between different SAMs may be caused by the electric energy needed to degrade the SAM and the organizations of the SAM with the different alkyl chain length in spite of the similar energy offset. The length of the alkyl chain affects the widths of lines in line patterns, and the diameters of dots in dot patterns, also.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Colloids and Surfaces A: Physicochemical and Engineering Aspects - Volume 253, Issues 1â3, 1 February 2005, Pages 23-26
Journal: Colloids and Surfaces A: Physicochemical and Engineering Aspects - Volume 253, Issues 1â3, 1 February 2005, Pages 23-26
نویسندگان
Bumsu Kim, Georgios Pyrgiotakis, Jason Sauers, Wolfgang M. Sigmund,