کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9749022 | 1493799 | 2005 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Comprehensive two-dimensional liquid chromatography for the characterization of functional acrylate polymers
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی آنالیزی یا شیمی تجزیه
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چکیده انگلیسی
Comprehensive two-dimensional liquid chromatography-size-exclusion chromatography (LCÂ ÃÂ SEC) was investigated as a tool for the characterization of functional poly(methyl methacrylate) (PMMA) polymers. Ultraviolet-absorbance and evaporative light-scattering detection (ELSD) were used. A simple method to quantify ELSD data is presented. Each data point from the ELSD chromatogram can be converted into a mass concentration using experimental calibration curves. The qualitative and quantitative information obtained on two representative samples is used to demonstrate the applicability of LCÂ ÃÂ SEC for determining the mutually dependent molar-mass distributions (MMD) and functionality-type distributions (FTD) of functional polymers. The influence of the molar mass on the retention behavior in LC was investigated using LCÂ ÃÂ SEC for hydroxyl-functional PMMA polymers. The critical conditions, at which retention is - by definition - independent of molar mass, were not exactly the same for PMMA series with different end-groups. Our observations are in close agreement with theoretical curves reported in the literature. However, for practical applications of LCÂ ÃÂ SEC it is not strictly necessary to work at the exact critical solvent composition. Near-critical conditions are often sufficient to determine the mutually dependent distributions (MMD and FTD) of functional polymers.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Chromatography A - Volume 1076, Issues 1â2, 27 May 2005, Pages 51-61
Journal: Journal of Chromatography A - Volume 1076, Issues 1â2, 27 May 2005, Pages 51-61
نویسندگان
Xulin Jiang, Aschwin van der Horst, Vincent Lima, Peter J. Schoenmakers,