X-ray photoabsorption and total electron yield of Fe thin films at the L2,3 edge

We have studied thin Fe films by soft X-ray absorption spectroscopy to determine the total electron yield (TEY) sampling depth (λe) at the Fe L2,3 edge. For this, we have recorded high-resolution X-ray absorption spectra in TEY resolving the near edge X-ray absorption fine structure (NEXAFS). Our analysis yields a value of λe = 21 ± 2 Å for the TEY sampling depth.