کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9817743 | 1518771 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Dual gate oxide integrity improvement by implementing nitrogen implantation technology
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Dual gate oxide layers were implemented in 0.15 μm Mask ROM device. Two predominant approaches were carried out to achieve a combination of thin and thick gate oxides. One was the conventional, growth-etching-growth, process and another one was oxidation on wafers with pre-gate-oxide nitrogen implantation. The retardation rate of oxidation was dependent on the nitrogen implant dosage but independent on implant energy. For thin gate oxide, device performance by using nitrogen implantation prior to gate oxide demonstrated better thickness uniformity and breakdown voltage than that by using conventional approach. Furthermore, directly formed thick gate oxide achieved better thickness uniformity and breakdown voltage than that of the grow-etching-grow process.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 237, Issues 1â2, August 2005, Pages 183-187
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 237, Issues 1â2, August 2005, Pages 183-187
نویسندگان
Tuung Luoh, Jung-Yu Hsieh, Ling-Wuu Yang, Chi-Tung Huang, Kuang-Chao Chen, Henry Chung, Joseph Ku, Chih-Yuan Lu,