کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9829416 | 1524490 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Epitaxial growth and characterization of Fe thin films on wurtzite GaN(0Â 0Â 0Â 1)
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
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چکیده انگلیسی
Fe films of different thicknesses were deposited on wurtzite GaN(0Â 0Â 0Â 1) layers by electron beam evaporation. They were studied by a number of characterization techniques such as low-energy electron diffraction (LEED), X-ray diffraction (XRD), atomic force microscopy (AFM), Rutherford backscattering spectrometry (RBS), and ferromagnetic resonance (FMR). Despite the large lattice mismatch between Fe and wurtzite GaN a clear epitaxial relation was determined. Three distinct Fe domain orientations were found rotated by 120â relative to each other. Due to the formation of crystalline domains a hexagonal in-plane magnetic anisotropy was observed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 283, Issues 3â4, 1 October 2005, Pages 500-507
Journal: Journal of Crystal Growth - Volume 283, Issues 3â4, 1 October 2005, Pages 500-507
نویسندگان
R. Meijers, R. Calarco, N. Kaluza, H. Hardtdegen, M.v.d. Ahe, H.L. Bay, H. Lüth, M. Buchmeier, D.E. Bürgler,