کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9829416 1524490 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Epitaxial growth and characterization of Fe thin films on wurtzite GaN(0 0 0 1)
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
Epitaxial growth and characterization of Fe thin films on wurtzite GaN(0 0 0 1)
چکیده انگلیسی
Fe films of different thicknesses were deposited on wurtzite GaN(0 0 0 1) layers by electron beam evaporation. They were studied by a number of characterization techniques such as low-energy electron diffraction (LEED), X-ray diffraction (XRD), atomic force microscopy (AFM), Rutherford backscattering spectrometry (RBS), and ferromagnetic resonance (FMR). Despite the large lattice mismatch between Fe and wurtzite GaN a clear epitaxial relation was determined. Three distinct Fe domain orientations were found rotated by 120∘ relative to each other. Due to the formation of crystalline domains a hexagonal in-plane magnetic anisotropy was observed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 283, Issues 3–4, 1 October 2005, Pages 500-507
نویسندگان
, , , , , , , , ,