BiSrCaCuO compounds rich in copper synthesized by molecular beam epitaxy structural and electric properties

The resulting complex nanostructure is in contrast with rather rough surfaces in the range of 10 nm as measured by atomic force microscopy, a strong c-axis texturation and a full epitaxy within the ab-plane as confirmed by four-circle X-ray diffraction. The local structure of the films was examined by high-resolution transmission electron microscopy (HRTEM) which allows determining the distribution of sizes of the domains. The results analysed using the theory of percolation show a 3D character of conductivity in the studied films.