کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9837401 | 1525275 | 2005 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The compositional dependence of the structural and optical properties of amorphous As20Se80âxTlx films
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Thermal evaporation technique was used to deposit various samples of As20Se80âxTlx on a glass substrate where (5⩽x⩽35 at%). The XRD studies were carried out for thin films of As20Se80âxTlx, where the results confirm the amorphous nature for the as-deposited films. Chemical compositions of thin films analysis were done using EDS. The optical energy gap Egopt of the as-deposited films was determined from transmission and reflection spectra. The decrease of Egopt , with increasing Tl content was attributed to the effect of localized states. The optical constants n, k could be determined and were found to increase with the increasing of Tl-content. The dielectric constants (εâ and εL) were increasing with the increasing of Tl-content. Dispersion parameters were determined according to Wemple-DiDomenico relationship.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica B: Condensed Matter - Volume 368, Issues 1â4, 1 November 2005, Pages 179-187
Journal: Physica B: Condensed Matter - Volume 368, Issues 1â4, 1 November 2005, Pages 179-187
نویسندگان
M.M. El-Nahass, M. Dongol, M. Abou-zied, A. El-Denglawey,