کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9837401 1525275 2005 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The compositional dependence of the structural and optical properties of amorphous As20Se80−xTlx films
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
The compositional dependence of the structural and optical properties of amorphous As20Se80−xTlx films
چکیده انگلیسی
Thermal evaporation technique was used to deposit various samples of As20Se80−xTlx on a glass substrate where (5⩽x⩽35 at%). The XRD studies were carried out for thin films of As20Se80−xTlx, where the results confirm the amorphous nature for the as-deposited films. Chemical compositions of thin films analysis were done using EDS. The optical energy gap Egopt of the as-deposited films was determined from transmission and reflection spectra. The decrease of Egopt , with increasing Tl content was attributed to the effect of localized states. The optical constants n, k could be determined and were found to increase with the increasing of Tl-content. The dielectric constants (ε∞ and εL) were increasing with the increasing of Tl-content. Dispersion parameters were determined according to Wemple-DiDomenico relationship.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica B: Condensed Matter - Volume 368, Issues 1–4, 1 November 2005, Pages 179-187
نویسندگان
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