Electron trapping by excited microvoids does not give rise to a Staebler-Wronski effect

It is shown that the model of electron trapping by excited microvoids recently proposed by Krüger and Sax (Physica B 353 (2004) 263) does not lead to the phototransport features that are characteristic for the Staebler-Wronski effect. According to that model, a photoinduced degradation, if present at all, would show a characteristic time constant of the order of a few milliseconds rather than the experimentally observed 1000 h.