Microscopic structure in pressure sensitive adhesives: an ultrasmall angle X-ray study

We applied ultrasmall angle X-ray scattering (USAX) in the context of pressure sensitive adhesive (PSA) debonding. Microscopic structures, as detected by USAX, complete macroscopic structural information from standard optical microscopy. As a model PSA, a statistical copolymer was investigated. Asymmetric USAX pattern were detected. The data are modelled by a tilted one-dimensional grating of slits.