کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9841742 | 1525795 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Critical properties of MgB2 thin films on NbN/Si substrate under perpendicular magnetic fields
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
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چکیده انگلیسی
Critical magnetic properties of MgB2 thin films grown on NbN/Si substrate were investigated under magnetic fields perpendicular to the film surface. Polycrystalline MgB2 films were prepared by sequential evaporation of boron and magnesium on NbN buffered Si substrate followed by an in situ annealing. AC and DC magnetizations were measured by the PPMS system. From the onset of AC diamagnetic susceptibilities, the upper critical fields were estimated resulting in the temperature derivative of about â5Â kOe/K at lower temperatures. Critical current densities were evaluated from DC magnetization hystereses to be more than 1Â MA/cm2 below 14Â K (self field). Critical properties including irreversibility fields were examined in comparison with those under parallel magnetic fields.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica C: Superconductivity - Volumes 426â431, Part 1, 1 October 2005, Pages 340-344
Journal: Physica C: Superconductivity - Volumes 426â431, Part 1, 1 October 2005, Pages 340-344
نویسندگان
Akihiko Nishida, Chihiro Taka, Stefan Chromik, Rudolf Durny,