کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9841850 | 1525801 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Transmission electron microscopy of Tl-1223 films on lanthanum aluminate
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Transmission electron microscopy of Tl-1223 films on lanthanum aluminate Transmission electron microscopy of Tl-1223 films on lanthanum aluminate](/preview/png/9841850.png)
چکیده انگلیسی
The microstructure of (Tl, Pb)-1223 films on (1 0 0)LaAlO3 single-crystalline substrate was investigated on cross-sections of the specimens by conventional transmission electron microscopy in combination with selected area electron diffraction and by high resolution transmission electron microscopy. The (Tl, Pb)-1223 films showed the presence of the planar defects such as stacking faults and twins on the [1 0 0] planes. The numerous planar defects are accompanied by visible dislocations. Sporadically CaO grains were identified as secondary phase in the (Tl, Pb)-1223 film by energy dispersive X-ray diffraction point analysis and by X-ray mapping. The adhesion of the Tl-1223 film to the substrate was excellent.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica C: Superconductivity - Volume 423, Issues 1â2, 15 June 2005, Pages 63-68
Journal: Physica C: Superconductivity - Volume 423, Issues 1â2, 15 June 2005, Pages 63-68
نویسندگان
Kazimierz Przybylski, Oliver Heiml, Gerhard Gritzner,