The application of polyimide/silicon nitride dual passivation to AlxGa1−xN/GaN high electron mobility transistors Fulltext Access 6 Pages 2008
Influence of sidewall spacer on threshold voltage of MOSFET with high-k gate dielectric Fulltext Access 6 Pages 2008
Experimental verification of models for underfill flow driven by capillary forces in flip-chip packaging Fulltext Access 6 Pages 2008
dc-Conduction mechanism in lanthanum–manganese oxide films grown on p-Si substrate Fulltext Access 6 Pages 2008
Characteristics of ZnO thin films prepared by radio frequency magnetron sputtering Fulltext Access 6 Pages 2008
Suppression of Ge–O and Ge–N bonding at Ge–HfO2 and Ge–TiO2 interfaces by deposition onto plasma-nitrided passivated Ge substrates: Integration issues Ge gate stacks into advanced devices Fulltext Access 6 Pages 2008
A junction characterization for microelectronic devices quality and reliability Fulltext Access 6 Pages 2008
Structural design optimization for board-level drop reliability of wafer-level chip-scale packages Fulltext Access 6 Pages 2008
Bulk built in current sensors for single event transient detection in deep-submicron technologies Fulltext Access 6 Pages 2008
Force-fed evaporation and condensation utilizing advanced micro-structured surfaces and micro-channels Fulltext Access 6 Pages 2008
Electro-thermal modeling of multifinger AlGaN/GaN HEMT device operation including thermal substrate effects Fulltext Access 6 Pages 2008
A 2D threshold-voltage model for small MOSFET with quantum-mechanical effects Fulltext Access 6 Pages 2008
A threshold voltage model for short-channel MOSFETs taking into account the varying depth of channel depletion layers around the source and drain Fulltext Access 6 Pages 2008
Transient analysis on hygroscopic swelling characterization using sequentially coupled moisture diffusion and hygroscopic stress modeling method Fulltext Access 6 Pages 2008
Analytical model for multi-junction solar cells prediction in space environment Fulltext Access 6 Pages 2008
Improved sensing characteristics of MISiC Schottky-diode hydrogen sensor by using HfO2 as gate insulator Fulltext Access 6 Pages 2008
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks Fulltext Access 6 Pages 2008
Exciton states in wurtzite and zinc-blende InGaN/GaN coupled quantum dots Fulltext Access 6 Pages 2008
Design of adaptive supply voltage for sub-threshold logic based on sub-1 V bandgap reference circuit Fulltext Access 6 Pages 2008
Non-ideal behavior of a driving resonator loop in a vibratory capacitive microgyroscope Fulltext Access 6 Pages 2008
A 1.2 V current-mode true RMS–DC converter based on the floating gate MOS translinear principle Fulltext Access 6 Pages 2008
Atom-like behaviors and orbital-related Tomonaga-Luttinger liquids in carbon nano-peapod quantum dots Fulltext Access 6 Pages 2008
Landscape phage as a molecular recognition interface for detection devices Fulltext Access 6 Pages 2008
Towards atomic-scale design: A theoretical investigation of magnetic nanoparticles and ultrathin films Fulltext Access 6 Pages 2008
High-Tc superconductivity in entirely end-bonded multi-walled carbon nanotubes Fulltext Access 6 Pages 2008
Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing tests Fulltext Access 6 Pages 2008
Test response reuse-based SoC core test compression and test scheduling for test application time minimization Fulltext Access 6 Pages 2008
Design formula for band-switching capacitor array in wide tuning range low-phase-noise LC-VCO Fulltext Access 6 Pages 2008
Experimental characterization and numerical analysis of the 4H-SiC p–i–n diodes static and transient behaviour Fulltext Access 6 Pages 2008
Effect of the interface states on the cell parameters of a thin film quasi-monocrystalline porous silicon as an active layer Fulltext Access 6 Pages 2008
Semiconductor terahertz detectors and absorption enhancement using plasmons Fulltext Access 6 Pages 2008
Polaron effects on the energy of a hydrogenic donor impurity in GaAs–(Ga,Al)As quantum-well wires Fulltext Access 6 Pages 2008
Miniband properties of superlattice quantum dot arrays fabricated by the edge-defined nanowires Fulltext Access 6 Pages 2008
Monitoring of carrier lifetime distribution in high power semiconductor device technology Fulltext Access 6 Pages 2008
The interface states analysis of the MIS structure as a function of frequency Fulltext Access 6 Pages 2008
Microstructure of eutectic 80Au/20Sn solder joint in laser diode package Fulltext Access 6 Pages 2008
High density self assembled nanoparticle film with temperature-controllable interparticle spacing for deep sub-wavelength nanolithography using localized surface plasmon modes on planar silver nanoparticle tunable grating Fulltext Access 6 Pages 2008
A novel fabrication process of MEMS devices on polyimide flexible substrates Fulltext Access 6 Pages 2008
Investigation of the doping and thickness effects of polysilicon oxide by rapid thermal N2O oxidation Fulltext Access 6 Pages 2008
Characterization of sputtered tungsten nitride film and its application to Cu electroless plating Fulltext Access 6 Pages 2008
The frequency and voltage dependent electrical characteristics of Al–TiW–Pd2Si/n-Si structure using I–V, C–V and G/ω–V measurements Fulltext Access 6 Pages 2008
On the temperature dependence of series resistance and interface states in Al/SiO2/p-Si (MIS) Schottky diodes Fulltext Access 6 Pages 2008
Some electrical properties of polyaniline/p-Si/Al structure at 300 K and 77 K temperatures Fulltext Access 6 Pages 2008
A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor Fulltext Access 6 Pages 2008
Temperature dependence of the dielectric properties of polymer composite based RF capacitors Fulltext Access 6 Pages 2008
Dynamic avalanche in diodes with local lifetime control by means of palladium Fulltext Access 6 Pages 2008
Reliability of reverse properties of power semiconductor devices:: Influence of surface dielectric layer and its experimental verification Fulltext Access 6 Pages 2008
Design methodology for configurable analog to digital conversion using support vector machines Fulltext Access 6 Pages 2008
Piezoresistive effect in GaAs/InxGa1−xAs/AlAs resonant tunneling diodes for application in micromechanical sensors Fulltext Access 6 Pages 2008
A circuit-compatible analytical device model for ballistic nanowire transistors Fulltext Access 6 Pages 2008
Fabrication of a new micro bio chip and flow cell cytometry system using Bio-MEMS technology Fulltext Access 6 Pages 2008
Center embossed diaphragm design guidelines and Fabry–Perot diaphragm fiber optic sensor Fulltext Access 6 Pages 2008
Study on TiO2-doped ZnO thick film gas sensors enhanced by UV light at room temperature Fulltext Access 6 Pages 2008
Electric field-enhanced metal-induced lateral crystallization and P-channel poly-Si TFTs fabricated by it Fulltext Access 6 Pages 2008
Solder joint and trace line failure simulation and experimental validation of fan-out type wafer level packaging subjected to drop impact Fulltext Access 6 Pages 2008
Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications Fulltext Access 6 Pages 2008
Layout analysis as supporting tool for failure localization: Basic principles and case studies Fulltext Access 6 Pages 2008
Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition Fulltext Access 6 Pages 2008
Reliability assessment of integrated power transistors: Lateral DMOS versus vertical DMOS Fulltext Access 6 Pages 2008
Conditional time resolved photoemission for debugging ICs with intermittent faults Fulltext Access 6 Pages 2008
Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology Fulltext Access 6 Pages 2008
Advanced thermal failure analysis and reliability investigations – Industrial demands and related limitations Fulltext Access 6 Pages 2008
Charging and discharging phenomena in electrostatically-driven single-crystal-silicon MEM resonators: DC bias dependence and influence on the series resonance frequency Fulltext Access 6 Pages 2008
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications Fulltext Access 6 Pages 2008
Lifetime analysis of solder joints in high power IGBT modules for increasing the reliability for operation at 150 °C Fulltext Access 6 Pages 2008
Transmission-line-matrix (TLM) modeling of self-heating in AlGaN/GaN transistor structures Fulltext Access 6 Pages 2008
Failure analysis of pad-height effects in the fine-pitch interconnection of the anisotropic conductive films Fulltext Access 6 Pages 2008
Temperature dependence of electrical parameters of SMD ferrite components for EMI suppression Fulltext Access 6 Pages 2008
Simulation of transient thermal states in layered electronic microstructures Fulltext Access 6 Pages 2008
Characterization of defects in flexible circuits with ultrasonic atomic force microscopy Fulltext Access 6 Pages 2008
Accurate negative bias temperature instability lifetime prediction based on hole injection Fulltext Access 6 Pages 2008
Leakage currents and dielectric breakdown of Si1−x−yGexCy thermal oxides Fulltext Access 6 Pages 2008
Study and formation of 2D microstructures of sapphire by focused ion beam milling Fulltext Access 6 Pages 2008