Restoring defect structures in 3C-SiC/Si (0Â 0Â 1) from spherical aberration-corrected high-resolution transmission electron microscope images by means of deconvolution processing
Keywords: 61.72 لک; 68.37.Og; 42.30.âd; 61.72.Nn; 61.72.Lk; 68.55.ag; Aberration-corrected high-resolution transmission electron microscopy; Image deconvolution; Stacking fault; Lomer dislocation; Perfect 60° dislocation; 3C-SiC/Si;