
Reflection high-energy electron diffraction study of molecular beam epitaxy growth of Pr2O3 on Si(0 0 1)
Keywords: B2 مواد دی الکتریک; 61.14.Hg; 81.15.Hi; 77.84.−sA1. Reflection high-energy electron diffraction; A3. Molecular beam epitaxy; B2. Dielectric materials