Keywords: طیف سنجی جرمی ثانویه (سیمس); Secondary ion mass spectrometry (SIMS); Storing matter technique; Quantification; Oxygen flooding
مقالات ISI طیف سنجی جرمی ثانویه (سیمس) (ترجمه نشده)
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Keywords: طیف سنجی جرمی ثانویه (سیمس); Ketamine; Whole blood; Drug screening; Secondary ion mass spectrometry (SIMS); Principal-components analysis (PCA); Gas chromatography–mass spectrometry (GC–MS)
Keywords: طیف سنجی جرمی ثانویه (سیمس); Soft-landing; Ruthenium trisbipyridine; Ion-surface collisions; Self-assembled monolayer (SAM); Secondary ion mass spectrometry (SIMS); Charge retention;
Effect of boron on the tensile and creep properties of a newly developed Ni-Fe-based weld metal
Keywords: طیف سنجی جرمی ثانویه (سیمس); Solidification microstructure; Secondary ion mass spectrometry (SIMS); Grain boundary Segregation; Mechanical properties; Superalloy; Electron energy loss spectroscopy (EELS);
The Hyperion-II radio-frequency oxygen ion source on the UCLA ims1290 ion microprobe: Beam characterization and applications in geochemistry and cosmochemistry
Keywords: طیف سنجی جرمی ثانویه (سیمس); Hyperion ion source; Secondary ion mass spectrometry (SIMS);
Integration of paper-based microarray and time-of-flight secondary ion mass spectrometry (ToF-SIMS) for parallel detection and quantification of molecules in multiple samples automatically
Keywords: طیف سنجی جرمی ثانویه (سیمس); Paper analytical device (PAD); Glass microfiber; Self-assembled monolayer (SAM); Secondary ion mass spectrometry (SIMS); C60 ion;
Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+-Ar+ cosputtering
Keywords: طیف سنجی جرمی ثانویه (سیمس); Cluster ion; C60+-sputtering; X-ray photoelectron spectrometry (XPS); Secondary ion mass spectrometry (SIMS); Depth profiles; Temperature effect;
Relationships between colour and diagenesis in the aragonite-calcite speleothems in Basajaún Etxea cave, Spain
Keywords: طیف سنجی جرمی ثانویه (سیمس); Speleothem; Aragonite; Diagenesis; Secondary ion mass spectrometry (SIMS); Isotope geochemistry
Growth rate variation and potential paleoceanographic proxies in Primnoa pacifica: Insights from high-resolution trace element microanalysis
Keywords: طیف سنجی جرمی ثانویه (سیمس); Sclerochronology; Growth rates; Paleotemperature; Productivity; Primnoa; Octocoral; Mg/Ca ratio; Secondary ion mass spectrometry (SIMS); Northeast Pacific;
Differential ion beam sputtering of segregated phases in aluminum casting alloys
Keywords: طیف سنجی جرمی ثانویه (سیمس); Secondary ion mass spectrometry (SIMS); X-ray photoelectron spectroscopy (XPS); Scanning probe microscopy (SPM); Interface; Oxide-film growth kinetics; 3-Dimensional mapping;
Low-temperature growth of InxGa1âxN films by radio-frequency magnetron sputtering
Keywords: طیف سنجی جرمی ثانویه (سیمس); InxGa1âxN films; Grazing incidence X-ray diffraction (GIXRD); X-ray photoelectron spectroscopy (XPS); Secondary ion mass spectrometry (SIMS); Oxygen contamination;
Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques
Keywords: طیف سنجی جرمی ثانویه (سیمس); Sputter depth profiling; Glow discharge optical emission spectroscopy (GDOES); Mo/Si interferential mirror; Round-robin characterization; Secondary ion mass spectrometry (SIMS); Time-of-flight low-energy ion scattering (TOF-LEIS)
The fate of subducted oceanic slabs in the shallow mantle: Insights from boron isotopes and light element composition of metasomatized blueschists from the Mariana forearc
Keywords: طیف سنجی جرمی ثانویه (سیمس); Blueschist; Izu-Bonin-Marianas subduction zone; Secondary ion mass spectrometry (SIMS); Time-of-Flight (ToF)-SIMS; Boron isotopes; Mélange
Surface pretreatment of austenitic stainless steel and copper by chemical, plasma electrolytic or CO2 cryoblasting techniques for sol–gel coating
Keywords: طیف سنجی جرمی ثانویه (سیمس); Plasma electrolytic; CO2 cryoblasting; Pickling; X-ray photoelectron spectroscopy (XPS); Secondary ion mass spectrometry (SIMS)
Effect of fabrication process on the microstructure and the efficiency of organic light-emitting diode
Keywords: طیف سنجی جرمی ثانویه (سیمس); 81.70.Jb; 85.60.Jb; 85.65.+hOrganic light-emitting diode; C60 cluster ion beam; X-ray photoelectron spectrometry (XPS); Secondary ion mass spectrometry (SIMS)
Molecular SIMS - A journey from single crystal to biological surface studies
Keywords: طیف سنجی جرمی ثانویه (سیمس); Secondary ion mass spectrometry (SIMS); Chemisorption; Surface structure; Biological surfaces; Depth profiling; 2D and 3D imaging;
SIMS and GDMS depth profile analysis of hard coatings
Keywords: طیف سنجی جرمی ثانویه (سیمس); Glow discharge mass spectrometry (GDMS); Secondary ion mass spectrometry (SIMS); Ion sputtering; Hard coatings; Depth profile analysis
Characterization of silicate glasses doped with gold by solid-state field-assisted ion exchange
Keywords: طیف سنجی جرمی ثانویه (سیمس); Glass; Diffusion; Electric field effect; Secondary ion mass spectrometry (SIMS)
Quadrupole-based glow discharge mass spectrometer: Design and results compared to secondary ion mass spectrometry analyses
Keywords: طیف سنجی جرمی ثانویه (سیمس); Glow discharge mass spectrometry (GDMS); Secondary ion mass spectrometry (SIMS); Ion sputtering
Charge retention by peptide ions soft-landed onto self-assembled monolayer surfaces
Keywords: طیف سنجی جرمی ثانویه (سیمس); Surface-induced dissociation; Ion soft-landing; Ion-surface collisions; Peptides; Self-assembled monolayers; Secondary ion mass spectrometry (SIMS); Fourier transform ion cyclotron resonance mass spectrometry (FT-ICR MS)
Vertical phase separation in spin-coated films of a low bandgap polyfluorene/PCBM blend-Effects of specific substrate interaction
Keywords: طیف سنجی جرمی ثانویه (سیمس); Conjugated polymer; X-ray photoelectron spectroscopy (XPS); Secondary ion mass spectrometry (SIMS); Spinodal decomposition; Adsorption; Thiophene;
The effect of arsenic fluence on the boron diffusion in the polysilicon on monosilicon during rapid thermal annealing
Keywords: طیف سنجی جرمی ثانویه (سیمس); 61.72.TtUltra-shallow junctions; Polysilicon; Implantation; Rapid thermal annealing; Secondary ion mass spectrometry (SIMS)
Mesoscale structure in electrodeposited nanocrystalline Ni–Fe alloys
Keywords: طیف سنجی جرمی ثانویه (سیمس); Nanocrystalline; Electrodeposition; Mesostructure; Secondary ion mass spectrometry (SIMS); Transmission electron microscopy (TEM)
Active parts for CH4 decomposition and electrochemical oxidation at metal/oxide interfaces by isotope labeling-secondary ion mass spectrometry
Keywords: طیف سنجی جرمی ثانویه (سیمس); Solid oxide fuel cells (SOFCs); Anode/electrolyte interfaces; Isotope labeling; Secondary ion mass spectrometry (SIMS); XANES/EXAFS
Materials and reaction mechanisms at anode/electrolyte interfaces for SOFCs
Keywords: طیف سنجی جرمی ثانویه (سیمس); Solid oxide fuel cells; Anode/electrolyte interfaces; Anode reaction mechanism; Secondary ion mass spectrometry (SIMS); Isotope labeling
The Akoya pearl oyster shell as an archival monitor of lead exposure
Keywords: طیف سنجی جرمی ثانویه (سیمس); Lead (Pb); Pearl oyster; Shell; Secondary ion mass spectrometry (SIMS); Biomonitor
Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements
Keywords: طیف سنجی جرمی ثانویه (سیمس); 68.55.Nq; 82.80.Ms; Depth profiling; Ion-beam sputtering; Ion-induced secondary electron emission; Ionic liquids; Multilayer structures; Secondary ion mass spectrometry (SIMS);
Useful ion yields for Cameca IMS 3f and 6f SIMS: Limits on quantitative analysis
Keywords: طیف سنجی جرمی ثانویه (سیمس); Secondary ion mass spectrometry (SIMS); Trace element geochemistry; Isotope geochemistry; Analytical technique
SIMS investigation of gettering centres produced by phosphorus MeV ion implantation
Keywords: طیف سنجی جرمی ثانویه (سیمس); 61.72.Tt; 61.72.Yx; 68.49.Sf; 82.80.Ms; Ion implantation; Gettering effect and defects; RP-, RP/2- and trans-RP-effect; Secondary ion mass spectrometry (SIMS);
Structural and compositional characterization of X-cut LiNbO3 crystals implanted with high energy oxygen and carbon ions
Keywords: طیف سنجی جرمی ثانویه (سیمس); 77.84.Dy; 61.72.Ww; 81.70.Jb; 61.10.Nz; Lithium niobate; Ion implantation; Radiation damage; Secondary ion mass spectrometry (SIMS); X-ray diffraction;
Simulations of arsenic and boron co-implanted in silicon during RTA for ultra-shallow junctions realizations
Keywords: طیف سنجی جرمی ثانویه (سیمس); Silicon; Implantation; Rapid thermal annealing; Simulation; Secondary ion mass spectrometry (SIMS); Diffusivity;
Compositional and structural analysis of iron doped X-cut lithium niobate crystals
Keywords: طیف سنجی جرمی ثانویه (سیمس); Lithium niobate; Sputtering; Iron; Secondary ion mass spectrometry (SIMS); X-ray diffraction; Diffusion;
Investigation of the interface region between a porous silicon layer and a silicon substrate
Keywords: طیف سنجی جرمی ثانویه (سیمس); 68.35.-p; 68.35.Ct; Interfaces; Atomic force microscopy (AFM); X-ray diffraction; Secondary ion mass spectrometry (SIMS);
Imaging of CH4 decomposition around the Ni/YSZ interfaces under anodic polarization
Keywords: طیف سنجی جرمی ثانویه (سیمس); SOFC; Imaging; Secondary ion mass spectrometry (SIMS); Isotope labeling; Ni/YSZ interface;
Depth profile characterization of electrodeposited multi-thin-film structures by low angle of incidence X-ray diffractometry
Keywords: طیف سنجی جرمی ثانویه (سیمس); 60.10.Kw; Depth profiling; Multilayers; Secondary ion mass spectrometry (SIMS); X-ray diffraction;
High-temperature oxidation of CrN/AlN multilayer coatings
Keywords: طیف سنجی جرمی ثانویه (سیمس); 68.55.Nq; 82.80.Ms; Depth profiling; Mass-resolved ion scattering spectrometry (MARISS); Nitride multilayer coatings; Secondary ion mass spectrometry (SIMS); X-ray photoelectron spectroscopy (XPS); Unbalanced magnetron sputtering;