
Growth of thin zirconium and zirconium oxides films on the n-GaN(0Â 0Â 0Â 1) surface studied by XPS and LEED
Keywords: طیف سنجی فوتوالکتر اشعه ایکس; Zirconium; Zirconium dioxide; Gallium nitride; Semiconductor/insulator interfaces; X-ray photoelectron spectroscopy; Low energy electron diffraction;