Keywords: بازتابی از اشعه ایکس; Single crystal diamond; Mechanical polishing; Surface roughness; X-ray reflectometry; Atomic force microscopy;
مقالات ISI بازتابی از اشعه ایکس (ترجمه نشده)
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Keywords: بازتابی از اشعه ایکس; X-ray reflectivity; Polarized neutron reflectivity; Interdiffusion; Self-diffusion; Intermetallic alloy phases; Annealing; Diffusion length; Solid state reaction; Activation energy for diffusion; Ni/Al, Ni/Ti and Ni/Ge multilayers; XRD; X-ray diffraction;
Keywords: بازتابی از اشعه ایکس; Bioresponsive interface; Calmodulin; Poly(ethylene glycol); X-ray reflectometry;
Keywords: بازتابی از اشعه ایکس; Silicon carbide; Thin films; Nanostructures; Atoms substitution method; Dilatation dipole; X-ray reflectometry;
Keywords: بازتابی از اشعه ایکس; Protein DAMP4; Foaming; Dynamic surface tension; Adsorption kinetics; X-ray reflectometry;
Keywords: بازتابی از اشعه ایکس; X-Ray reflectometry; Neutron reflectometry; Curved interface; Polyelectrolyte multilayers
Keywords: بازتابی از اشعه ایکس; Characterization; Subnanometric layer; Cr/Sc multilayer; Fabry-Pérot mirror; X-ray reflectometry;
Thermal stability of phase change GaSb\GeTe, SnSe\GeTe and GaSb\SnSe double stacked films revealed by X-ray reflectometry and X-ray diffraction
Keywords: بازتابی از اشعه ایکس; X-ray reflectometry; X-ray diffraction; Thin films; Semiconductors; Data storage materials;
Structural evolution of a Ni/NiOx based supercapacitor in cyclic charging-discharging: A polarized neutron and X-ray reflectometry study
Keywords: بازتابی از اشعه ایکس; Nickel; Nickel oxide; Supercapacitor; Polarized neutron reflectometry; X-ray reflectometry;
Optical properties and oxidation resistance of different transition metals for soft X-ray and EUV applications
Keywords: بازتابی از اشعه ایکس; Grazing incidence EUV mirrors; EUV reflectivity; X-ray reflectometry; Oxidation resistant; Ruthenium; Molybdenum; Palladium; Niobium;
Membrane restructuring following in situ sialidase digestion of gangliosides: Complex model bilayers by synchrotron radiation reflectivity
Keywords: بازتابی از اشعه ایکس; Gangliosides; NEU2; X-ray reflectometry; Single model membrane; Biomembrane; GEMs;
Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils
Keywords: بازتابی از اشعه ایکس; Atomic fundamental parameters; X-ray fluorescence spectroscopy; Fluorescence yield; X-ray reflectometry; Quantitative analysis;
Formation of palladium hydrides in low temperature Ar/H2-plasma
Keywords: بازتابی از اشعه ایکس; Palladium hydride; Low temperature plasma; Grazing incidence X-ray diffractometry; X-ray reflectometry; Hydrogen absorption; Hydrogen desorption; Phase transformation
Interdiffusion processes at irradiated Cr/Si interfaces
Keywords: بازتابی از اشعه ایکس; X-ray reflectometry; Cr/Si interfaces; Interdiffusion; Ion beam mixing;
High-resolution X-ray characterization of mid-IR Al0.45Ga0.55As/GaAs Quantum Cascade Laser structures
Keywords: بازتابی از اشعه ایکس; Quantum Cascade Lasers; X-ray diffraction; X-ray reflectometry;
On the supramacromolecular structure of core-shell amphiphilic macromolecules derived from hyperbranched polyethyleneimine
Keywords: بازتابی از اشعه ایکس; Hyperbranched polymers; Core-shell amphiphilic macromolecules; X-ray Scattering; X-ray Reflectometry;
High resolution X-ray and electron microscopy characterization of PZT thin films prepared by RF magnetron sputtering
Keywords: بازتابی از اشعه ایکس; PZT; RF sputtering; Perovskite phase; Residual stress; X-ray reflectometry; Cross sectional transmission electron microscopy;
A study of the layer structure in a calix-8-arene Langmuir-Blodgett film by reflectometry
Keywords: بازتابی از اشعه ایکس; X-ray reflectometry; Calixarene; Pinched-loop; Macrocycle;
Investigation of periodic Ni–Ti multilayers
Keywords: بازتابی از اشعه ایکس; Neutron reflectometry; X-ray reflectometry; Neutron supermirrors
Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry
Keywords: بازتابی از اشعه ایکس; Spectroscopic ellipsometry; X-ray reflectometry; VUV reflectometry; Atomic layer deposition; Ultra-thin layer
Effect of interface morphology on intermetallics formation upon annealing of Al-Ni multilayer
Keywords: بازتابی از اشعه ایکس; Intermetallics; Magnetic films and multilayers; Surfaces and interfaces; Diffusion; Neutron reflectometry; X-ray reflectometry;
On the layer structures in acid- and amine-substituted calixarene Langmuir–Blodgett films
Keywords: بازتابی از اشعه ایکس; X-ray reflectometry; Calixarene; LB film; Pinched loop
Alkoxysilane layers compatible with Cu deposition: Towards new diffusion barriers?
Keywords: بازتابی از اشعه ایکس; Self-assembled monolayer; Supercritical CO2; X-ray reflectometry; Neutron reflectometry; Diffusion barriers
Investigation of morphological and electrical characteristics of tin doped indium oxide layers produced by a quasi single source precursor system
Keywords: بازتابی از اشعه ایکس; Transparent conducting oxides; Indium tin oxide; Precursor system; Sol-gel deposition; X-ray reflectometry; Stress; Texture; Resistance;
Sorption and optical properties of sol-gel thin films measured by X-Ray Reflectometry and Ellipsometric Porosimetry
Keywords: بازتابی از اشعه ایکس; Titanium dioxide; Silicon dioxide; Sorption properties; Optical properties; Sol-gel; X-Ray Reflectometry; Ellipsometric Porosimetry;
Influence of the surface roughness on the properties of Au films measured by surface plasmon resonance and X-ray reflectometry
Keywords: بازتابی از اشعه ایکس; Surface plasmon resonance; X-ray reflectometry; Gold; Thin films; Optical properties; Evaporation
Systematic combination of X-ray reflectometry and spectroscopic ellipsometry: A powerful technique for reliable in-fab metrology
Keywords: بازتابی از اشعه ایکس; Spectroscopic ellipsometry; X-ray reflectometry; Transparent conductive oxide; Amorphous carbon;
Densification of amorphous sol–gel TiO2 films: An X-ray reflectometry study
Keywords: بازتابی از اشعه ایکس; Titanium dioxide; Sol–gel deposition; X-ray reflectometry; Thin films; Densification
Determination of sodium migration in sol-gel deposited titania films on soda-lime glass with r.f. glow discharge optical emission spectroscopy
Keywords: بازتابی از اشعه ایکس; 47.54.Jk; GD-OES; Na migration; TiO2 films; X-ray reflectometry; Soda-lime glass;
Structural and optical properties of amorphous oxygenated iron boron nitride thin films produced by reactive co-sputtering
Keywords: بازتابی از اشعه ایکس; Amorphous thin films; Boron nitride; Co-sputtering; Spectroscopy characterization; X-ray reflectometry; Optical properties
UHV-type synchrotron radiation reflectometer
Keywords: بازتابی از اشعه ایکس; X-ray reflectometry; Vacuum apparatus; Reflectometer; 61.05.cm; 07.30.-t; 07.60.Hv;
Growth and structural characterization of molecular superlattice of quaterrylene and N,N′-dioctyl-3,4,9,10-perylenedicarboximide
Keywords: بازتابی از اشعه ایکس; 61.05.cm; 68.35.bm; 68.35.Ct; 68.60.Dv; 68.65.CdOrganic semiconductor; Superlattice; X-ray reflectometry; Ultra-slow deposition
Investigation of optical spacer layers from solution based precursors for polymer solar cells using X-ray reflectometry
Keywords: بازتابی از اشعه ایکس; Polymer solar cells; Plastic solar cells; Optical spacers; Titanium oxide; X-ray reflectometry
Thermal and irradiation induced interdiffusion in magnetite thin films grown on magnesium oxide (0Â 0Â 1) substrates
Keywords: بازتابی از اشعه ایکس; RBS; Channeling; MBE; CEMS; X-ray reflectometry; Magnetite Fe3O4; Ion beam modification;
Alkoxysilane layers deposited by SC CO2 process on silicon oxide for microelectronics applications
Keywords: بازتابی از اشعه ایکس; Self-assembled monolayer; Supercritical CO2; X-ray reflectometry; Alkoxysilane
Structure, composition and crystallinity of epitaxial magnetite thin films
Keywords: بازتابی از اشعه ایکس; RBS; Channeling; MBE; CEMS; Magnetite Fe3O4; X-ray reflectometry;
Investigation of HfNx-based films by Rutherford backscattering spectrometry and X-ray reflectometry
Keywords: بازتابی از اشعه ایکس; 62.20.Dc; 82.80.Yc; 61.10.Kw; HfNx-based films; Rutherford backscattering spectrometry; X-ray reflectometry;
Polarized neutron reflectometry of the influence of Fe/Si, Fe/FeSi2 and Au/Fe interfaces on the magnetic properties of epitaxial Fe films
Keywords: بازتابی از اشعه ایکس; 75.70.−i; 61.05.cm; 61.05.fjPolarized neutron reflectometry; X-ray reflectometry; Epitaxy; Metal–semiconductor interface; Magnetic structure
All-optical switching device for infrared based on PbTe quantum dots
Keywords: بازتابی از اشعه ایکس; All optical switching devices; Pulsed Laser Deposition; PECVD; Semiconductor quantum dots; GISAXS; X-ray reflectometry
Three characterization techniques coupled with adsorption for studying the nanoporosity of supported films and membranes
Keywords: بازتابی از اشعه ایکس; Ellipsometry; Quartz crystal microbalance; X-ray reflectometry; Coupled methods; Adsorption–desorption isotherms at room temperature
Characterisation of alkyl-functionalised Si(1 1 1) using reflectometry and AC impedance spectroscopy
Keywords: بازتابی از اشعه ایکس; X-ray reflectometry; AC impedance spectroscopy; Self-assembled monolayer; Thin film;
Applying grazing incidence X-ray reflectometry (XRR) to characterising nanofilms on mica
Keywords: بازتابی از اشعه ایکس; XRR; Thin films; Nanofilms; X-ray reflectometry; Mica; Surface-grown polymer brushes; Surface characterisation
Studies of oxide-based thin-layered heterostructures by X-ray scattering methods
Keywords: بازتابی از اشعه ایکس; X-ray reflectometry; X-ray diffractometry; High-k oxides; ZnO;
Study of thermal aging effect on space charge in poly(methyl methacrylate)
Keywords: بازتابی از اشعه ایکس; PMMA; Trapped charges; Thermal aging; Thermal step current; Thermally stimulated depolarization currents; X-ray reflectometry
Characteristics of polyelectrolyte multilayers: Effect of PEI anchoring layer and posttreatment after deposition
Keywords: بازتابی از اشعه ایکس; Polyelectrolyte multilayers; LbL technique; Ellipsometry; X-ray reflectometry; Wetting
Density, thickness and composition measurements of TiO2SiO2 thin films by coupling X-ray reflectometry, ellipsometry and electron probe microanalysis-X
Keywords: بازتابی از اشعه ایکس; TiO2-SiO2; Ellipsometry; XPS measurements; X-ray reflectometry; EPMA;
Structural characterisation of GaAlN/GaN HEMT heterostructures
Keywords: بازتابی از اشعه ایکس; X-ray reflectometry; GaAlN/GaN heterostructures; High electron mobility transistors; Thickness determination; Fourier inversion method;
Structural, optical and mechanical properties of aluminium nitride films prepared by reactive DC magnetron sputtering
Keywords: بازتابی از اشعه ایکس; Aluminium nitride; Sputtering; Optical properties; X-ray reflectometry; Stress
Determination of thickness, density and roughness of Co–Ni–Al single and multiple layer films deposited by high-vacuum e-beam evaporation on different substrates
Keywords: بازتابی از اشعه ایکس; 68.65.Ac; 61.10.Kw; 68.55.Jk; 68.35.CtMultiple layers; Thickness; Roughness; X-ray reflectometry
Structure of biomembrane-on-silicon hybrids derived from X-ray reflectometry
Keywords: بازتابی از اشعه ایکس; Biomolecular monolayer; Purple membrane; Si wafer; X-ray reflectometry; Bacteriorhodopsin