Radiation-tolerance analysis of I-gate n-MOSFET according to isolation oxide module in the CMOS bulk process

Radiation-tolerance analysis of I-gate n-MOSFET according to isolation oxide module in the CMOS bulk process

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 200, 15 November 2018, Pages 45-50

Minwoong Lee, Seongik Cho, Namho Lee, Jongyeol Kim,