کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10364055 871361 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Origins of debris and mitigation through a secondary RF plasma system for discharge-produced EUV sources
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Origins of debris and mitigation through a secondary RF plasma system for discharge-produced EUV sources
چکیده انگلیسی
RF plasma based mitigation has been studied as an improved debris mitigation scheme for extreme ultraviolet (EUV) sources. The RF plasma ionizes sputtered neutral debris and, when used in conjunction with a collimator (also known as a foil trap), inhibits that debris from reaching the collector optics. An ionization fraction of 61 ± 3% has been measured. In addition, increased scattering of the ion component of the debris has led to a decrease in erosive flux reaching the diagnostics. Results from in situ high-precision quartz crystal oscillators, ex situ surface characterization (Auger, XPS), and secondary plasma characterization is presented for a series of mitigation schemes, including a foil trap in conjunction with the RF plasma.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 77, Issue 2, February 2005, Pages 95-102
نویسندگان
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