کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10364777 871819 2005 14 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Optimizing the precision of the four-point bend test for the measurement of thin film adhesion
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Optimizing the precision of the four-point bend test for the measurement of thin film adhesion
چکیده انگلیسی
The four-point bend test (4PB) has emerged as the test method of choice for adhesion studies of thin films. The precision of the 4PB test is examined here by studying the effect of notch depth, pressing speed, specimen width, edge polishing, and pin spacing. It is shown that proper control of these variables is critical for obtaining high precision, statistically significant, and reproducible 4PB test data. Finite element analyses are presented in order to further understand and interpret the experimental results.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 82, Issue 2, October 2005, Pages 99-112
نویسندگان
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