کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10620895 | 988724 | 2007 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Grain to grain slip activity in plastically deformed Zr determined by X-ray micro-diffraction line profile analysis
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Grain to grain slip activity in plastically deformed Zr determined by X-ray micro-diffraction line profile analysis Grain to grain slip activity in plastically deformed Zr determined by X-ray micro-diffraction line profile analysis](/preview/png/10620895.png)
چکیده انگلیسی
The slip system activity in individual grains of a plastically deformed Zircaloy-2 specimen was determined by micro-diffraction X-ray line profile analysis measurements at the ID22 beam line of the European Synchrotron Radiation Facility synchrotron in Grenoble, France. The grain to grain orientation map was determined by electron back scattering diffraction (EBSD) and this was used for orienting individual grains to produce specific Bragg reflections. Anisotropic X-ray line broadening was evaluated in terms of dislocation densities, the average sub-grain size and slip activity. Slip line traces were evaluated in the EBSD micrographs in correlation with the grain orientation. The X-ray and EBSD correlation indicated that ãaã-type dislocations with considerable prismatic slip activity dominated plastic deformation in this alloy and that, with increasing dislocation density, the fractions of ãaã- and ãcã-type dislocations increased.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 55, Issue 3, February 2007, Pages 1117-1127
Journal: Acta Materialia - Volume 55, Issue 3, February 2007, Pages 1117-1127
نویسندگان
T. Ungár, O. Castelnau, G. Ribárik, M. Drakopoulos, J.L. Béchade, T. Chauveau, A. Snigirev, I. Snigireva, C. Schroer, B. Bacroix,