Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers

We present a simple method for the characterization of the dynamical behavior of the SThM Wollaston wire thermal resistive probe using Si/SiGe microcoolers. Measurements show a time response of about 186 μs. This value confirms the value found in the literature. Measurements also allow us to determine the total thermal tip-sample contact resistance ZThC.