کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10668700 1008385 2010 11 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation
چکیده انگلیسی
► Ring-core procedure was proposed and validated for residual stress analysis at the micro-scale. ► Complete stress relief was demonstrated when trench depth approaches stub diameter. ► New method minimises artifacts due to FIB milling process, improving accuracy and resolution. ► Proposed technique was validated for the important practical case of thin coatings. ► Method can be generalized, e.g. to include stress depth profiling and non-equibiaxial stress.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 205, Issue 7, 25 December 2010, Pages 2393-2403
نویسندگان
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