کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
11030290 | 1646355 | 2018 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A novel method using MOS electronic nose and ELM for predicting postharvest quality of cherry tomato fruit treated with high pressure argon
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
نرم افزارهای علوم کامپیوتر
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: A novel method using MOS electronic nose and ELM for predicting postharvest quality of cherry tomato fruit treated with high pressure argon A novel method using MOS electronic nose and ELM for predicting postharvest quality of cherry tomato fruit treated with high pressure argon](/preview/png/11030290.png)
چکیده انگلیسی
Flavor characteristic, caused by a series of physicochemical changes, is an important part of fruit quality and freshness. The purpose of this study was to investigate the reliability and validity of using electronic nose (e-nose) technology to evaluate the quality and freshness of cherry tomatoes after high pressure argon treatments. Extreme learning machine (ELM) and Partial least squares (PLS) were applied for quality parameters prediction. The results showed that freshness of cherry tomatoes based on flavor characteristic over the entire storage time displayed four groups (fresh, acceptable, stale and very stale, respectively). High pressure argon at 0.8â¯MPa significantly maintained the freshness and quality of cherry tomatoes during cold storage. ELM models showed better performance than PLS models for evaluating the firmness, SSC and pH values according to their higher fitting correlation coefficients (R2â¯>â¯0.9500). The results demonstrated e-nose technology combined with ELM provided a reliable and valid method for evaluating quality and freshness of cherry tomatoes during cold storage.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Computers and Electronics in Agriculture - Volume 154, November 2018, Pages 411-419
Journal: Computers and Electronics in Agriculture - Volume 154, November 2018, Pages 411-419
نویسندگان
Lei Feng, Min Zhang, Bhesh Bhandari, Zhimei Guo,