کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1446280 | 988606 | 2013 | 11 صفحه PDF | دانلود رایگان |
A biaxial device developed at DiffAbs beamline of the SOLEIL synchrotron facility has been employed to determine the applied strains in film–substrate composites using both X-ray diffraction and digital image correlation measurements. Such an experimental combination is used for the first time to determine the yield surface of a polycrystalline thin film deposited on a polyimide substrate. In situ biaxial tensile tests under different biaxial planar load ratios were performed on W/Cu nanocomposite thin films deposited on flexible substrates. The effect of loading path on the yield stress of W/Cu nanocomposites is presented by considering a large range of proportional loadings. By comparing experimental results with theoretical models, this study reveals the brittle behaviour of W/Cu nanocomposite thin films at small deformations.
Journal: Acta Materialia - Volume 61, Issue 13, August 2013, Pages 5067–5077