Characterization of mobile type I and type II twin boundaries in 10M modulated Ni–Mn–Ga martensite by electron backscatter diffraction

Mobile type I and type II twin boundaries mediating the magnetic field-induced strain in five-layered modulated (10M) Ni–Mn–Ga martensite were analyzed by electron backscatter diffraction. Taking into account the slight monoclinic distortion of the pseudo-tetragonal lattice, the electron backscatter diffraction study reveals domains of 0.01–1 mm thickness adjacent to the type I and type II twin boundaries. The domains differing in the modulation direction are {1 0 0) compound twins and their effect on twinning stress is discussed. Detailed analysis of type II twin boundary reveals that the domains are further internally twinned by compound {1 1 0) twins 1–15 μm in size. An additional example of a complex twin microstructure combining type I and type II twin boundaries is presented.