کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1446837 | 988626 | 2012 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
High strength-ductility of thin nanocrystalline palladium films with nanoscale twins: On-chip testing and grain aggregate model
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: High strength-ductility of thin nanocrystalline palladium films with nanoscale twins: On-chip testing and grain aggregate model High strength-ductility of thin nanocrystalline palladium films with nanoscale twins: On-chip testing and grain aggregate model](/preview/png/1446837.png)
چکیده انگلیسی
The mechanical behaviour of thin nanocrystalline palladium films with an ∼30 nm in plane grain size has been characterized on chip under uniaxial tension. The films exhibit a large strain hardening capacity and a significant increase in the strength with decreasing thickness. Transmission electron microscopy has revealed the presence of a moderate density of growth nanotwins interacting with dislocations. A semi-analytical grain aggregate model is proposed to investigate the impact of different contributions to the flow behaviour, involving the effect of twins, of grain size and of the presence of a thin surface layer. This model provides guidelines to optimizing the strength/ductility ratio of the films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 60, Issue 4, February 2012, Pages 1795–1806
Journal: Acta Materialia - Volume 60, Issue 4, February 2012, Pages 1795–1806
نویسندگان
M.-S. Colla, B. Wang, H. Idrissi, D. Schryvers, J.-P. Raskin, T. Pardoen,