Detailed investigations on La2Zr2O7 buffer layers for YBCO-coated conductors prepared by chemical solution deposition

An extensive study of the growth and properties of La2Zr2O7 (LZO) buffer layers prepared by chemical solution deposition on Ni–5 at.%W rolling-assisted biaxially textured substrates, which is presently of great interest for the preparation of YBa2Cu3O7−x-coated conductors, is presented. The main focus was on the understanding of the decomposition of the precursor layers, and their growth and texture formation, as well as their structural evolution during annealing, leading to highly biaxially textured LZO buffer layers. Therefore, various characterization methods, including spectroscopic analysis techniques, X-ray diffraction techniques, and other techniques, were applied. Epitaxially grown LZO buffer layers of high performance, showing a strong cube texture up to the surface, a crack-free surface morphology of low roughness, and a sufficient barrier function against Ni diffusion from the substrate, were reproducibly obtained.