کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1508227 1511066 2008 14 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Measurement of mechanical properties of electronic materials at temperatures down to 4.2 K
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Measurement of mechanical properties of electronic materials at temperatures down to 4.2 K
چکیده انگلیسی

Operating temperatures of spacecraft components in the ‘subzero’ range are encountered during solar eclipse periods or when voyaging on deep-space missions. Moreover some spacecraft instruments or parts of them, e.g. sensors, have to be cooled to obtain an improved performance, e.g. in spacecraft missions like the infrared space observatory (ISO) and CryoSat. Materials utilized in the assembly of electronic circuits can be subjected to mechanical loading at cryogenic temperatures. [Semerad E, Scholze P, Schmidt M, Wendrinsky W. Effect of new cleaning liquids on electronic materials and parts. ESA metallurgy report no. 3275; January 2002, [1]].Within the present work the mechanical properties of electronic materials at cryogenic temperatures down to liquid helium temperature were analysed. Specifically the tensile properties of solders (63Sn37Pb, 62Sn36Pb2Ag, 60Sn40Pb, 96Sn4Ag, 50In50Pb, 70Pb30In, 96.8Pb1.5Ag1.7Sn, 96.5Sn3Ag0.5Cu), PC boards (MLB polyimide glass fibre, MLB epoxy glass fibre, MLB Thermount), conformal coatings (Arathane 5750, Sylgard 184, Scotchcast 280, Solithane 113, CV-1144-0, Mapsil 213, Conathane EN4/EN11) as well as OFE Cu were characterised at room temperature, at liquid nitrogen and at liquid helium temperature by tensile tests.The fracture surface of tested samples was examined by means of optical microscope and if necessary with scanning electron microscope.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Cryogenics - Volume 48, Issues 11–12, November–December 2008, Pages 497–510
نویسندگان
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