FPA annealing studies for the WISE mission cryostat

This paper summarizes the results of some top-level sensitivity studies that characterize the effects of FPA annealing on a solid hydrogen cryostat-using the WISE cryostat and focal plane assemblies as a model. These trades provide a vector for candidate system level changes to the WISE instrument to help mitigate the impact of the annealing process on the cryostat's performance.