Investigation of defect modes in a defective photonic crystal with a semiconductor metamaterial defect

• Tunable defect modes with a semiconductor metamaterial are analyzed.
• Number of defect modes decrease as the defect thickness increases
• Defect mode frequency is blue-shifted for both TE and TM waves.

In this work, we theoretically investigate the properties of defect modes in a defective photonic crystal containing a semiconductor metamaterial defect. We consider the structure, (LH)N/DP/(LH)N, where N and P are respectively the stack numbers, L is SiO2, H is InP, and defect layer D is a semiconductor metamaterial composed of Al-doped ZnO (AZO) and ZnO. It is found that, within the photonic band gap, the number of defect modes (transmission peaks) will decrease as the defect thickness increases, in sharp contrast to the case of using usual dielectric defect. The peak height and position can be changed by the variation in the thickness of defect layer. In the angle-dependent defect mode, its position is shown to be blue-shifted as the angle of incidence increases for both TE and TM waves. The analysis of defect mode provides useful information for the design of tunable transmission filter in semiconductor optoelectronics.

We theoretically investigate the properties of defect modes in a defective photonic crystal containing a semiconductor metamaterial defect. It is found that, within the photonic band gap, the number of defect modes (transmission peaks) will decrease as the defect thickness increases, in sharp contrast to the case of using usual dielectric defect.Figure optionsDownload as PowerPoint slide